%0 Conference Article
%T MATHEMATICAL MODEL FOR CALCULATING THE FAILURE CROSS-SECTION OF MICROCIRCUITS UNDER PROTON RADIATION EXPOSURE
%A Kotlyarov, V.V.
%K radiation hardness, microcircuits, proton radiation, failure cross-section, mathematical modeling, secondary ions
%J PHYSICAL BASIS OF SCIENCE-INTENSIVE TECHNOLOGIES IN THE MODERN WORLD
%D 2025
%P 9
%I FSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov