%0 Conference Article
%T PROBLEMS OF EXISTING METHODS FOR CALCULATING THE RADIATION HARDNESS OF CMOS INTEGRATED CIRCUITS UNDER PROTON IRRADIATION
%A Kotlyarov, V.V.
%K CMOS, proton irradiation, TID, DDD, NIEL-scaling, SEE, radiation hardness, space electronics
%J PROBLEMS AND PROSPECTS IN SYSTEMS AND PROCESS MODELING
%D 2026
%P 7
%I FSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov