TY  CONF
TI  PROBLEMS OF EXISTING METHODS FOR CALCULATING THE RADIATION HARDNESS OF CMOS INTEGRATED CIRCUITS UNDER PROTON IRRADIATION
KW  CMOS
KW  proton irradiation
KW  TID
KW  DDD
KW  NIEL-scaling
KW  SEE
KW  radiation hardness
KW  space electronics
JO  PROBLEMS AND PROSPECTS IN SYSTEMS AND PROCESS MODELING
AU  Kotlyarov, V.V.
PY  2026
PB  FSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov