%0 Conference Article
%T SUDDEN AND PARAMETRIC FAILURES IN MICROELECTRONIC COMPONENTS: MECHANISMS, CLASSIFICATION AND METHODS OF RELIABILITY ASSURANCE
%A Skvorcova, E.I.
%A Yagodkin, A.S.
%A Zolnikov, V.K.
%K sudden failures, parametric failures, reliability, degradation of parameters, functional testing, fault tolerance
%J MODELING INFORMATION SYSTEMS AND TECHNOLOGIES – 2026
%D 2026
%P 7
%I FSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov