TY  CONF
TI  SUDDEN AND PARAMETRIC FAILURES IN MICROELECTRONIC COMPONENTS: MECHANISMS, CLASSIFICATION AND METHODS OF RELIABILITY ASSURANCE
KW  sudden failures
KW  parametric failures
KW  reliability
KW  degradation of parameters
KW  functional testing
KW  fault tolerance
JO  MODELING INFORMATION SYSTEMS AND TECHNOLOGIES – 2026
AU  Skvorcova, E.I.
AU  Yagodkin, A.S.
AU  Zolnikov, V.K.
PY  2026
PB  FSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov