%0 Conference Article
%T LAWS OF TIME-TO-FAILURE DISTRIBUTION IN MICROELECTRONICS
%A Skvorcova, E.I.
%A Yagodkin, A.S.
%A Zolnikov, V.K.
%K time to failure, reliability function, exponential distribution, Weibull distribution, lognormal distribution, failure rate, MTTF, microelectronics, reliability analysis
%J MODELING INFORMATION SYSTEMS AND TECHNOLOGIES – 2026
%D 2026
%P 6
%I FSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov