TY  CONF
TI  LAWS OF TIME-TO-FAILURE DISTRIBUTION IN MICROELECTRONICS
KW  time to failure
KW  reliability function
KW  exponential distribution
KW  Weibull distribution
KW  lognormal distribution
KW  failure rate
KW  MTTF
KW  microelectronics
KW  reliability analysis
JO  MODELING INFORMATION SYSTEMS AND TECHNOLOGIES – 2026
AU  Skvorcova, E.I.
AU  Yagodkin, A.S.
AU  Zolnikov, V.K.
PY  2026
PB  FSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov