TY  CONF
TI  RADIATION EFFECTS IN INTEGRATED CHIPS WHEN EXPOSED TO IONIZING RADIATION
KW  ionizing radiation
KW  parametric failures
KW  absorbed dose
KW  impact
KW  energy depend-ence of losses
KW  offset of atoms
KW  degradation
KW  equivalent changes
JO  Modern aspects of modeling systems and processes
AU  Zhuravleva, I.V.
PY  2024
PB  FSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov