00782naa#a2200169#i#450# EN\\bibl\16303 20250621054959.6 20250618b2025####ek#y0engy0150####ca RU INFLUENCE OF PROTON RADIATION ON THE DEGRADATION AND FAILURES OF RAM CHIPS Conference article/thesis Voronezh FSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov 2025 3 с. Conference article/thesis local Электронные элементы, использующие свойства твердого тела. Полупроводниковая электроника. 621.382 Kotlyarov V. V. Shevchenko A. V. bibl.vgltu.ru