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001     EN\\bibl\16831
005     20250901004940.1
100 ## _a20250825b2025####ek#y0engy0150####ca
102 ## _aRU
200 1# _aMATHEMATICAL MODEL FOR CALCULATING THE FAILURE CROSS-SECTION OF MICROCIRCUITS UNDER PROTON RADIATION EXPOSURE
       _eConference article/thesis
210 1# _aVoronezh
       _cFSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov
       _d2025
215 ## _a9 с.
608 ## _aConference article/thesis
       _2local
675 ## _aЭлектронные элементы, использующие свойства твердого тела. Полупроводниковая электроника. 621.382
       _z
700 #1 _aKotlyarov
       _gV. V.
856 4# _abibl.vgltu.ru
       _u