00783naa#a2200157#i#450# EN\\bibl\16831 20250831203124.7 20250825b2025####ek#y0engy0150####ca RU MATHEMATICAL MODEL FOR CALCULATING THE FAILURE CROSS-SECTION OF MICROCIRCUITS UNDER PROTON RADIATION EXPOSURE Conference article/thesis Voronezh FSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov 2025 9 с. Conference article/thesis local Электронные элементы, использующие свойства твердого тела. Полупроводниковая электроника. 621.382 Kotlyarov V. V. bibl.vgltu.ru