DEVELOPMENT OF MEANS FOR MONITORING THE PARAMETERS OF MICROCHIPS FOR ASSESSING RADIATION RESISTANCE

1. Voronezh State University of Forestry and Technologies named after G.F. Morozov
AO "Nauchno-issledovatel'skiy institut elektronnoy tehniki"
Russian Federation

2. Voronezh State University of Forestry and Technologies named after G.F. Morozov
Voronezh, Russian Federation

3. FSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov
Russian Federation

4. Voronezh State University of Forestry and Technologies named after G.F. Morozov

5. Voronezh State University of Forestry and Technologies named after G.F. Morozov
Russian Federation

6. Voronezh State University of Forestry and Technologies named after G.F. Morozov
AO "Nauchno-issledovatel'skiy institut elektronnoy tehniki"

Type:

Сonference article

DOI:

https://doi.org/10.34220/MAMSP_253-256

Published:

10.12.2021

Subject area:

UDK 62 Инженерное дело. Техника в целом. Транспорт

Language:

Russian

Keywords:

microcontroller, ultra-large integrated circuit (VLSI), VLSI fault tolerance, ion-izing radiation, radiation resistance

Abstract and keywords

Abstract (English):
This article discusses the technical means of monitoring the performance of a special-purpose ECB for experimental evaluation of radiation resistance, in the absence of test measuring equipment that allows you to control the areas of the most degraded degradation when exposed to ionizing radiation and heavy charged particles of outer space.

Keywords:
microcontroller, ultra-large integrated circuit (VLSI), VLSI fault tolerance, ion-izing radiation, radiation resistance

Text

Text (PDF): Read Download

References

1. Vybor znacheniy parametrov, opredelyayuschih kinetiku nakopleniya zaryada v dielektrike pri radiacionnom vozdeystvii / V. K. Zol'nikov, V. P. Kryukov, V. N. Achkasov, V. A.Sklyar // Modelirovanie sistem i processov. - 2015. - T.8, № 3. - S. 24-26.

2. Proektirovanie interfeysov sboeustoychivyh mikroshem / V.K. Zol'nikov, N.V. Mozgovoy, S.V. Grechanyy, I.N. Selyutin, I.I. Strukov // Modelirovanie sistem i processov. - 2020. - T. 13, № 1. - S. 17-24.

3. Sozdanie testovogo okruzheniya i poryadok zagruzki testov v processe proektirovaniya mikroshem / K.A. Chubur, A.Yu. Kulay, A.L. Savchenko, K.V. Zol'nikov, A.E. Gridnev // Modelirovanie sistem i processov. - 2020. - T. 13, № 1. - S. 83-87.

4. Razrabotka materialov i radiacionno-stoykoy EKB na osnove KNS/KNI struktur / I.I. Strukov, S.V. Grechanyy, A.S. Yagodkin, A.N. Chernikov // Modelirovanie sistem i processov. - 2020. - T. 13, № 2. - S. 72-76.

5. Osobennosti tehnologicheskogo processa izgotovleniya mikroshem kosmicheskogo naznacheniya po tehnologii KMOP KNS / V.K. Zol'nikov, S.A. Evdokimova, I.V. Zhuravleva, E.A. Maklakova, A.A. Ilunina // Modelirovanie si-stem i processov. - 2020. - T. 13, № 3. - S. 53-58.

6. Zol'nikov, V.K. Matematicheskoe obespechenie ucheta impul'snogo izlucheniya v SAPR skvoznogo proektirovaniya SBIS / V.K. Zol'nikov // Sistemy upravleniya i informacionnye tehnologii. - 2009. - № 1-2 (35). - S. 242-244.

7. Razrabotka testovogo kristalla pri proektirovanii mikroshem tehnologii KMOP / V.K. Zol'nikov, O.V. Oksyuta, K.A. Chubur, O.N. Kvasov // Modelirovanie sistem i processov. - 2020. - T. 13, № 3. - S. 58-65.

8. Osobennosti proektirovaniya bazovyh elementov mikroshem kosmicheskogo naznacheniya / V.K. Zol'nikov, T.V. Skvorcova, I.I. Strukov, A.A. Ilunina, E.A. Maklakova // Modelirovanie sistem i processov. - 2020. - T. 13, № 3. - S. 66-70.

9. Zol'nikov, V.K. Obzor programm dlya SAPR submikronnyh SBIS i uchet elektrofizicheskih effektov gluboko submikronnogo urovnya / V.K. Zol'nikov, A.L. Savchenko, A.Yu. Kulay // Modelirovanie sistem i processov. - 2019. - T. 12, № 1. - S. 40-47.

10. Modifikaciya metoda poiska informacii v seti internet na osnove ispol'zovaniya metodov induktivnogo rassuzhdeniya / V.V. Lavlinskiy, A.L. Savchenko, I.A. Zemcov, O.G. Ivanova // Modelirovanie sistem i processov. - 2019. - T. 12, № 1. - S. 61-67.

11. Savchenko, A.L. Analiz suschestvuyuschih modeley i algoritmov dlya proektirovaniya slozhnyh funkcional'nyh blokov, stoykih k vozdeystviyu tyazhelyh zaryazhennyh chastic / A.L. Savchenko // Modelirovanie sistem i processov. - 2019. - T. 12, № 1. - S. 79-86.

12. Yagodkin, A.S. Matematicheskie modeli dozovyh effektov elektron-noy komponentnoy bazy kosmicheskogo naznacheniya / A.S. Yagodkin, V.I. Anciferova, D.I. Vladimirov // Modelirovanie sistem i processov. - 2019. - T. 12, № 1. - S. 93-101.

Submit manuscript Download PDF
Text

To cite

Citations:

Confirmation

Регистрация