DEVELOPMENT OF MEANS FOR MONITORING THE PARAMETERS OF MICROCHIPS FOR ASSESSING RADIATION RESISTANCE

Zolnikov Konstantin Vladimirovich; Strukov I.; Chubur K.; Grechanyy Sergey Vladimirovich; Yagodkin A. Sergeevich; Grosheva Ekaterina Vladimirovna

doi:doi:10.34220/MAMSP_253-256

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DEVELOPMENT OF MEANS FOR MONITORING THE PARAMETERS OF MICROCHIPS FOR ASSESSING RADIATION RESISTANCE

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DEVELOPMENT OF MEANS FOR MONITORING THE PARAMETERS OF MICROCHIPS FOR ASSESSING RADIATION RESISTANCE

Section: SECTION 2. COMPUTER-AIDED DESIGN SYSTEMS

Proceedings: MATERIALS OF THE ALL-RUSSIAN SCIENTIFIC AND PRACTICAL CONFERENCE "MODERN ASPECTS OF MODELING SYSTEMS AND PROCESSES"

UDK 62 Инженерное дело. Техника в целом. Транспорт

Zolnikov Konstantin Vladimirovich ¹

Strukov I. ²

Chubur K. ³

Grechanyy Sergey Vladimirovich ⁴

Yagodkin A. Sergeevich ⁵

Grosheva Ekaterina Vladimirovna ⁶

Author and publication information

Authors:

1. AO "Nauchno-issledovatel'skiy institut elektronnoy tehniki"
Russian Federation

2. Voronezh State University of Forestry and Technologies named after G.F. Morozov
Voronezh, Russian Federation

3. FSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov
Russian Federation

4. Voronezh State University of Forestry and Technologies named after G.F. Morozov

5. Voronezh State University of Forestry and Technologies named after G.F. Morozov
Russian Federation

6. AO "Nauchno-issledovatel'skiy institut elektronnoy tehniki"

Type:

Сonference article

DOI:

https://doi.org/10.34220/MAMSP_253-256

Published:

10.12.2021

Subject area:

UDK 62 Инженерное дело. Техника в целом. Транспорт

Language:

Russian

Keywords:

microcontroller, ultra-large integrated circuit (VLSI), VLSI fault tolerance, ion-izing radiation, radiation resistance

Abstract and keywords

Abstract (English):
This article discusses the technical means of monitoring the performance of a special-purpose ECB for experimental evaluation of radiation resistance, in the absence of test measuring equipment that allows you to control the areas of the most degraded degradation when exposed to ionizing radiation and heavy charged particles of outer space.

Keywords:
microcontroller, ultra-large integrated circuit (VLSI), VLSI fault tolerance, ion-izing radiation, radiation resistance

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References

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