Russian Federation
This paper introduces the design method of intelligent management system for experimental data of micro-electronic products, which realizes the collection, storage, query, analysis and visual display of experimental data, and provides powerful data support and decision-making basis for the research and development, production and quality control of micro-electronic products. The study of temperature characteristics of GaN HEMT devices is taken as an example to illustrate the application of experimental data intelligent management system for microelectronic products.
modeling, database, information system, GaN materials, GaN HEMT devices
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