Russian Federation
Russian Federation
This paper discusses the development of an information system for analyzing the reliability of logical combinational devices based on a formalized assessment of logic element failures and their impact on the correct functioning of the circuit. The relevance of the work is due to the increasing complexity of digital devices, the increase in integration density, and the need to ensure reliable reliability assessment at early stages of design without resorting to costly field tests. The proposed solution is focused on automated analysis of the combinational logic structure, calculation of reliability indicators taking into account the probabilities of element failures, and the formation of structured reports used in the optimization of circuit solutions and the selection of the element base.
information system, reliability, logic combinational device, failure analysis, logic elements, digital circuits, reliability assessment, analysis automation
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