PRODUCT LIFE ASSESSMENT METHODOLOGY UNDER RADIATION EXPOSURE

1. Voronezh State University of Forestry and Technologies named after G.F. Morozov
AO "Nauchno-issledovatel'skiy institut elektronnoy tehniki"
Russian Federation

2. Voronezh State University of Forestry and Technologies named after G.F. Morozov

3. Voronezh State University of Forestry and Technologies named after G.F. Morozov
Russian Federation

4. Voronezh State University of Forestry and Technologies named after G.F. Morozov

5. Scientific research institute electronic engineering

Type:

Сonference article

DOI:

https://doi.org/10.34220/MAMSP_247-252

Published:

10.12.2021

Subject area:

UDK 62 Инженерное дело. Техника в целом. Транспорт

Language:

Russian

Keywords:

microelectronics, VLSI, radiation exposure, outer space, ionization and structural effects, bipolar technology

Abstract and keywords

Abstract (English):
The article proposes a method for calculating and experimental evaluation of the service life of products in the specified radiation conditions of outer space. The described method of estimating the resource of products takes into account the additive nature of ionization and structural effects in the specified radiation conditions of outer space. This method includes experimental and computa-tional stages.

Keywords:
microelectronics, VLSI, radiation exposure, outer space, ionization and structural effects, bipolar technology

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References

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