Russian Federation
The article presents a methodology for end-to-end design of radiation-hardened integrated circuits based on specialized PDKs and radiation-oriented models. The approach ensures proper consideration of TID and SEU/SET effects, alignment of technological and circuit-level decisions, and improved predictability of radiation robustness.
radiation-hardened integrated circuits, space electronics, Total Ionizing Dose, Single Event Upset, specialized PDK, radiation models, end-to-end design, multi-level verification, microelectronics reliability, radiation effects modeling
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