Filial Rostovskogo gosudarstvennogo universiteta putey soobscheniya v g. Voronezhe
Russian Federation
In the onboard equipment, components of electronics, which have increased sensitivity to the effects of ionizing radiation are widely used. The transient processes in electronic products are particularly dangerous, associated with an absorbed dose of radiation, leading to functional or irre-versible failures in the operation of onboard systems.
ionizing radiation, parametric failures, absorbed dose, impact, energy depend-ence of losses, offset of atoms, degradation, equivalent changes
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