Russian Federation
Russian Federation
Russian Federation
This article examines the development and implementation of an automated system for quality control of integrated circuits on production lines of modern electronics manufacturers. The need to transition from traditional visual inspection methods to intelligent systems based on machine vision and neural network algorithms is substantiated. An analysis of the current state of automatic optical inspection (AOI), X-ray flaw detection, and electrical testing of integrated circuits is provided.
quality control, integrated circuits, automation, machine vision, neural networks, convolutional architecture, Industry 4.0, flaw detection, AOI, integrated circuit testing
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