Russian Federation
Russian Federation
This article analyzes the fundamental laws of time-to-failure distribution for microelectronic components and information systems–exponential, Weibull, lognormal, normal, and gamma distributions. Their mathematical functions (reliability R(t), density f(t), failure rate λ(t)), the physical meaning of the parameters, and their application areas for early, random, and wearout failures are described. Methods for estimating parameters (maximum likelihood, moments, and least squares) are considered. The role of selecting an adequate model for predicting reliability, planning maintenance, and improving the fault tolerance of electronic systems is emphasized.
time to failure, reliability function, exponential distribution, Weibull distribution, lognormal distribution, failure rate, MTTF, microelectronics, reliability analysis
1. Gurov, S. V. Nadezhnost' vosstanavlivaemyh rezervirovannyh sistem s posledeystviem otkazov / S. V. Gurov, L. V. Utkin // Avtomatika i telemehanika. – 2017. – № 1. – S. 137-151. – EDN XVRLFR.
2. Boran-Keshish'yan, A. L. Analiz nadezhnosti tehnicheskih sredstv slozhnyh cheloveko-mashinnyh sistem pri izvestnyh zakonah raspredeleniya vremeni do otkaza elementov / A. L. Boran-Keshish'yan // Vestnik Donskogo gosudarstvennogo tehnicheskogo universiteta. – 2013. – T. 13, № 5-6(74). – S. 59-67. – DOIhttps://doi.org/10.12737/1281. – EDN RVLNYD.
3. Korolev, A. E. Ocenka nadezhnosti mashin do pervogo otkaza / A. E. Korolev, T. G. Kolmakova // Vestnik Gosudarstvennogo agrarnogo universiteta Severnogo Zaural'ya. – 2013. – № 4(23). – S. 64-66. – EDN SDWPAL.
