Russian Federation
A mathematical model is proposed to estimate the failure cross-section of integrated circuits exposed to high-energy cosmic protons. The model takes into account the sensitive volume geometry, proton energy spectrum, nuclear interaction probability, and energy deposition from secondary particles. Analytical expressions for the rate of single event effects are derived. Graphical dependencies illustrating the effect of microcircuit parameters on radiation resistance are presented, as well as an analysis of the sensitivity of the model to changes in input data.
radiation hardness, microcircuits, proton radiation, failure cross-section, mathematical modeling, secondary ions
1. Agahanyan, T.M. Radiacionnye effekty v integral'nyh mikroshemah / T.M. Agahanyan, E.R. Astvacatur'yan, P.K. Skorobogatov. – Moskva: Energoatomizdat, 1989. – 256 s.
2. Pashkovskiy, M.E. Model' ocenki stoykosti poluprovodnikovyh izdeliy k vozdeystviyu tyazhelyh zaryazhennyh chastic kosmicheskogo prostranstva / M.E. Pashkovskiy, I.E. Pashkovskiy // Vestnik Voronezhskogo gosudarstvennogo tehnicheskogo universiteta.– 2012. – T. 8, № 1. – S. 58–60.
3. Lobanov, O.V. Peremezhayuschiesya otkazy, vyzvannye yadernymi reakciyami v ustroystvah elektronnoy tehniki pri obluchenii pervichnymi uskorennymi chasticami / O.V. Lobanov, M.V. Miroshkin, M.V. Stabnikov // Sredstva radioelektroniki. – 1988. – Vyp. 2. – 32 s.
4. Pashkovskiy, M.E. Model' energovydeleniya ot vysokoenergetichnyh protonov kosmicheskogo prostranstva / M.E. Pashkovskiy, V.F. Barabanov // Vestnik Voronezhskogo gosudarstvennogo tehnicheskogo universiteta. – 2010. – T. 6, № 9. – S. 45–48.
5. Metodicheskie ukazaniya po ocenke i obespecheniyu sboeustoychivosti i otkazoustoychivosti bortovoy apparatury. Ch. 2. / E.V. Gorchakov, V.V. Gerasimov, A.V. Chumakov, V.V. Uzhegov. – 2009. – 74 s.
6. Barabanov, V.F. Interaktivnye sredstva modelirovaniya slozhnyh tehnologicheskih processov / V.F. Barabanov, S.L. Podval'nyy. – Voronezh: Izd-vo VGTU, 2000. – 124 s.
7. Modelirovanie i simulyaciya secheniya sboev, inducirovannyh protonami i neytronami: unificirovannyy analiticheskiy podhod / G.I. Zebrev, N.N. Samotaev, R.G. Useynov [i dr.] // Radiation. – 2024. – T. 4, № 1. – Stat'ya 4. – DOI:https://doi.org/10.3390/radiation4010004.
8. Pryamaya ionizaciya protonami v submikronnyh tehnologiyah: metodiki ispytaniy i modelirovanie / S. Lüdeke, G.D. Cardenás, W. Hajdas [et al.] // IEEE Transactions on Nuclear Science. – 2023. – T. 70, № 3. – S. 667–677. – DOI:https://doi.org/10.1109/TNS.2023.3241937.
9. Novaya model' predskazaniya secheniy SEE ot protonov na osnove dannyh po tyazhelym ionam / J. Han, G. Guo, J. Liu [et al.] // Nuclear Instruments and Methods in Physics Research Section B. – 2022. – T. 526. – S. 62–67. – DOI:https://doi.org/10.1016/j.nimb.2022.02.009.
10. CREME96: obnovlennaya versiya koda ocenki vozdeystviya kosmicheskih luchey na mikroelektroniku / A.J. Tylka, J.H. Jr. Adams, P.R. Boberg [et al.] // IEEE Transactions on Nuclear Science. – 1997. – T. 44, № 6. – S. 2150–2160. – DOI:https://doi.org/10.1109/23.659030.
11. Kotlyarov, V.V. Metody zaschity cifrovyh ustroystv na baze PLIS ot ioniziruyuschego izlucheniya v usloviyah kosmicheskogo prostranstva / V.V. Kotlyarov, A.V. Shevchenko, V.I. Anciferova // Modelirovanie sistem i processov. – 2024. – №. 4. – S. 59-67. – DOI: https://doi.org/10.12737/2219-0767-2024-17-4-59-67.
